20 results
The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 620-621
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- August 2018
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Improved Z-axis Resolution in Serial Block Face SEM with Dual Primary Energies and Monte Carlo Simulation of Electron Scattering
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1440-1441
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- August 2018
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Is It Possible to Image the Auger Electron Signal in a Conventional SEM Using a Segmented Annular BSED and Stage Bias?
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 606-607
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- July 2016
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Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1107-1108
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- August 2015
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Sub-surface Serial Block Face Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1267-1268
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- August 2015
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Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 14-15
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- August 2014
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Modeling ion-solid interactions for imaging applications
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- MRS Bulletin / Volume 39 / Issue 4 / April 2014
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- 09 April 2014, pp. 342-346
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- April 2014
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X-ray Quantitative Microanalysis with an Annular Silicon Drift Detector
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 364-365
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- August 2013
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High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 360-361
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- August 2013
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The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same?
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 368-369
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- August 2013
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Modeling iSE Emission for Ion Beam Imaging
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 352-353
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- August 2013
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Orion NanoFab - 2nd Generation Helium Ion Microscope
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 854-855
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- August 2013
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Imaging Growth and Artifact in Natural Zircon – a simplified Preparation Protocol that allows “improved” High Resolution SE and BSE imaging and enhanced Geochronology “Targeting”: the “before” and “after” effect
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1724-1725
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- July 2012
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Imaging and X-ray Spectroscopy in an SEM during In Situ Heating
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 436-437
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- July 2012
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Modeling for Multi-Beam Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 798-799
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- July 2012
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A Point Projection Microscope for Electron Interferometry in the Reflection Mode
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 16 July 2003, pp. 966-967
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- August 2003
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Low Voltage Electron Holography - High Voltage Electron Holography
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 28-29
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- August 2002
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Low Voltage Nanotip Interferometry
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 520-521
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- August 2002
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Thermal Stress During Zone-Melting-Recrystallization of Silicon on Insulator Films: The Origin of Subboundaries and In-Plane Orientation of SOI
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- MRS Online Proceedings Library Archive / Volume 53 / 1985
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- 28 February 2011, 289
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- 1985
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Electron Beam Induced Current Studies of Nickel Silicide/Silicon Schottky Barrier Heights
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- MRS Online Proceedings Library Archive / Volume 56 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 163
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- 1985
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